IOC-MIPS_125a |
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10150C |
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Title: |
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MIPS Transfer Function Test |
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Objective: |
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Determination the optimum DC offset to use at the A-to-D Converter |
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Description: |
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including flow / state diagram |
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At each of 5 DC offset settings (use same as in thermal-vac test), take these dark data: |
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Put 24um array in dark. |
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Take 30 30-second exposures. |
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Put 70um array in one one of the dark positions. |
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Take 30 10-second exposures. |
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Put 160um array in dark. |
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Take 30 10-second exposures. |
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Place in Schedule: |
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After aperture door is opened. |
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(relative to water shed events) |
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Required Conditions: |
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MIPS Scattered light monitor must indicate that MIPS dark levels |
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are low enough ( <10,000 electrons/sec). |
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Assume T=5.5K for now. |
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Resources: |
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duration (best estimate) |
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3 hrs |
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real time downlink (Y / N) |
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no |
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special post event actions (Y / N) |
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no |
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Generates 450 DCEs. |
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Outcome: |
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description |
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Optimum DC offset level for each array will be known. |
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can proceed in parallel with other activity |
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yes so long as high sky background regions are not pointed at. |
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must outcome be confirmed before next event / test /activity |
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no |
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method of confirmation (sensor TLM, data analysis, etc.) |
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sensor TLM and data analysis |
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estimate of data turn around if required for confirmation |
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N/A |
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Unique or included in planned AOT? |
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Unique. |
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Contingency Plan: |
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"What if..." |
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If test fails to execute it must be repeated. If DC offset cannot be changed, circuit analysis will |
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be needed to understand the fault. |
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IOC Critical |
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Y |
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References: |
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Template last updated: |
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9/10/99 |
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M. Rieke |
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