MIPS_155a 24um Latent Images


IOC-MIPS_155a     10530C            
Title:   Characterize MIPS Latent Images and Saturated Source Behavior at 24um              
                   
Objective:   Understand the consequences of observing very bright sources with MIPS.              
                   
                   
Description:     Observations corresponding to 50%, 100%, and 500% of full well will be taken.            
including flow / state diagram     These saturation levels will be achieved through a combination of source selection and exposure times.            
                   
      At each of the three signal levels:            
        Observe a source using a 4x4 dither pattern using 10 second exposures.          
        Execute a flush cycle (reset,bias boost,more resets)          
                   
                   
Place in Schedule:   After aperture cover is opened.            
(relative to water shed events)                  
                   
Required Conditions:   MIPS apertures must have been located.            
      Detector aliveness and electronics checkouts must have been performed.            
      The background must be less than 2e-7 W/m^2/sr.            
      or T<31K            
Resources:                
                   
  duration (best estimate)         20 min      
  real time downlink (Y / N)         No      
  special post event actions (Y / N)         No      
  Generates 48 DCEs.                
                   
Outcome:                  
  description         After this test the consequences of observing very      
            bright sources will be understood.      
  can proceed in parallel with other activity       No, requires dedicated pointing.      
  must outcome be confirmed before next event / test /activity         No      
  method of confirmation (sensor TLM, data analysis, etc.)         data analysis      
  estimate of data turn around if required for confirmation         N/A      
                   
Unique or included in planned AOT?                  
      Uses photometry AOT and EOTs for anneals and flush cycles            
                 
Contingency Plan:                  
"What if..."     If unusually large effects are observed, more detailed study of anneal/flush cycles will be needed.            
                   
IOC Critical     Y            
                   
References:                  
                   
Template last updated:     9/6/99            
      M. Rieke            
                   
                   


Last Updated on 10/7/99
By Marcia Rieke
Email: mrieke@as.arizona.edu