MIPS_160a Anneal Freq


IOC-MIPS_160a     10490C,10220C            
Title:   Ge:Ga Anneal Frequency              
                   
Objective:   To Measure how frequently the MIPS Ge:Ga arrays need to be annealed.              
                   
Description:   Periodically take images with the stimulators at a given voltage              
    to measure responsivity change of the detectors and find the              
    transition into the unstable regime.         Related: This measurement could probably be obtained from data  
                taken for other purposes, since the anneal period is likely  
                a few hours.  
    This test could piggyback on the instrument stability tests and just use              
    the stim data produced there.              
                   
Place in Schedule:                  
    For 70um, background must be less than 1.2e-6 W/m^2/sr.              
    For 160um, background must be less than 5.3e-7 W/m^2/sr.              
    It may be possible to split this test into parts executed a different times based              
    on telescope temperature.              
    Basic instrument commanding and functionality must have been confirmed.              
                   
Required Conditions:   Stray light must be low enough not to saturate the detectors,              
    but it does not have to be low enough for routine science operations --              
    some background is OK.              
    PCS pointing and stability are not critical              
                   
Resources:                  
  duration (best estimate)         uses stability test data      
  real time downlink (Y / N)         No      
  special post event actions (Y / N)         Special data analysis      
                   
Outcome:                  
  description         uses stability test data      
  can proceed in parallel with other activity         Yes      
  must outcome be confirmed before next event / test /activity         Result will determine the anneal frequency and so will affect later operations.      
  method of confirmation (sensor TLM, data analysis, etc.)         Data analysis      
  estimate of data turn around if required for confirmation         48 hrs      
  number of DCEs         see stability test      
                   
Unique or included in planned uplink or downlink/analysis tool           see stability test      
            Special data analysis      
                   
Contingency Plan:           Acquire required data through normal operations.      
"What if..."           This is a test of conditions external to SIRTF and      
            cannot fail.      
                   
IOC Critical           Y      
                   
References:                  
                   
Template last updated:           12-Sep-99      
            C.W. Engelbracht      
                   
                   


Last Updated on 10/7/99
By Marcia Rieke
Email: mrieke@as.arizona.edu