| IOC-MIPS_210a | 10530C | ||||||||
| Title: | Characterize MIPS Latent Images and Saturated Source Behavior at 70 and 160um | ||||||||
| Objective: | Understand the consequences of observing very bright sources with MIPS. | ||||||||
| Description: | Observations corresponding to 50%, 100%, and 500% of full well will be taken. | ||||||||
| including flow / state diagram | These saturation levels will be achieved through a combination of source selection and exposure times. | ||||||||
| Part 1: | Saturation and latent image behavior of the 70um array. | ||||||||
| At each of three signal levels: | |||||||||
| Observe a source using a 4x4 dither pattern using 10 second exposures. | |||||||||
| Execute a thermal anneal. | |||||||||
| Part 2: | Saturation and latent image behavior of the 160um array. | ||||||||
| At each of three signal levels: | |||||||||
| Observe a source at 6 positions on the array using 10 second exposures. | |||||||||
| Execute a thermal anneal. | |||||||||
| Place in Schedule: | After aperture cover is opened. | ||||||||
| (relative to water shed events) | |||||||||
| Required Conditions: | MIPS apertures must have been located. | ||||||||
| Detector aliveness and electronics checkouts must have been performed. | |||||||||
| For the 160um array, the background must be less than 1e-8 W/m^2/sr. | |||||||||
| or T<6.5K | |||||||||
| Resources: | |||||||||
| duration (best estimate) | 40 min | ||||||||
| real time downlink (Y / N) | No | ||||||||
| special post event actions (Y / N) | No | ||||||||
| Generates 64 DCEs. | |||||||||
| Outcome: | |||||||||
| description | After this test the consequences of observing very | ||||||||
| bright sources will be understood. | |||||||||
| can proceed in parallel with other activity | No, requires dedicated pointing. | ||||||||
| must outcome be confirmed before next event / test /activity | No | ||||||||
| method of confirmation (sensor TLM, data analysis, etc.) | data analysis | ||||||||
| estimate of data turn around if required for confirmation | N/A | ||||||||
| Unique or included in planned AOT? | |||||||||
| Uses photometry AOT and IETs for anneals and flush cycles | |||||||||
| Contingency Plan: | |||||||||
| "What if..." | If unusually large effects are observed, more detailed study of anneal/flush cycles will be needed. | ||||||||
| IOC Critical | Y | ||||||||
| References: | |||||||||
| Template last updated: | 9/6/99 | ||||||||
| M. Rieke | |||||||||