IOC-MIPS_255a |
|
|
10520C,10600C,10700C |
|
|
|
|
|
|
Title: |
|
MIPS Radiometry tests: Sensitivity and Stability, both point sources and extended sources |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Objective: |
|
Determine the sensitivity to both point and extended sources and check the stability over a week time scale. |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Description: |
|
|
|
|
|
|
|
|
|
including flow / state diagram |
|
|
For each module two different celestial standards will be observed, one a calibrator star and |
|
|
|
|
|
|
|
|
|
the other a moderately high surface brightness extended source (will choose objects from IRAS or ISO programs). |
|
|
|
|
|
|
|
|
|
At 24 and 70 microns a nominal sensitivity of 100:1 will be achieved will at |
|
|
|
|
|
|
|
|
|
160um at least 10:1 will be achieved. The observed fluxes will be compared to |
|
|
|
|
|
|
|
|
|
the modelled throughput of MIPS and will be used to update subsequent |
|
|
|
|
|
|
|
|
|
estimates of sensitivity and integration times required . |
|
|
|
|
|
|
|
|
|
After this test has executed once, it must be repeated again approximately one day and one week later |
|
|
|
|
|
|
|
|
|
See attached page for listing of events |
|
|
|
|
|
|
Place in Schedule: |
|
|
|
|
|
|
|
|
|
(relative to water shed events) |
|
|
CTA and instrument must be at 5.5K. |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Required Conditions: |
|
|
Basic instrument functionality must be confirmed. |
|
|
|
|
|
|
|
|
|
MIPS throughput test must already be done. |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Resources: |
|
|
|
|
|
|
|
|
|
|
duration (best estimate) |
|
|
12 hrs |
(split into 6 2-hr sessions, 2 hr on pt. source, 2 hrs on extended, |
|
|
|
|
|
|
|
|
|
repeat pattern for a total of three executions) |
|
|
|
|
|
real time downlink (Y / N) |
|
|
No |
|
|
|
|
|
|
special post event actions (Y / N) |
|
|
No |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Outcome: |
|
|
|
|
|
|
|
|
|
|
description |
|
|
|
|
Final sensitivities will be available after the read noise test performed |
|
|
|
|
|
|
|
|
|
limited stability information will be available. |
|
|
|
|
can proceed in parallel with other activity |
|
|
|
|
No, dedicated observing |
|
|
|
|
must outcome be confirmed before next event / test /activity |
|
|
|
|
No |
|
|
|
|
method of confirmation (sensor TLM, data analysis, etc.) |
|
|
|
|
data analysis |
|
|
|
|
estimate of data turn around if required for confirmation |
|
|
|
|
N/A |
|
|
|
|
|
|
|
|
|
|
|
|
|
Unique or included in planned AOT? |
|
|
|
|
|
|
|
|
|
|
|
|
Uses standard AOTs but with non-standard pipeline processing as calibration data will be derived from this test. |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Contingency Plan: |
|
|
|
|
|
|
|
|
|
"What if..." |
|
|
If test fails for any reason or if repeatability is worse than ~10%, test must be repeated to understand why. |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
IOC Critical |
|
|
Y |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
References: |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Template last updated: |
|
|
27-Jul-98 |
M. Rieke |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Events: |
(Same as list for Throughput test, note that this sequence must be repeated for both the |
|
|
|
|
|
|
|
|
|
point source and the extended source and the entire pattern will be done three times a day and a week apart). |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
I. Throughput in Scan Map mode |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Make scan maps at each scan rate (slow,medium,fast) such that the star |
|
|
|
|
|
|
|
|
|
traverses each array. Repeat as needed to get 50 secs of exposure on the star. |
|
|
|
|
|
|
|
|
|
Use the scan map AOT. |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
II. Throughput in Photometry mode |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Place star on each array (24um,70um,160um) in turn. Take data in a 2x2 |
|
|
|
|
|
|
|
|
|
dither pattern on each array with 50secs (or nearest larger number given allowed |
|
|
|
|
|
|
|
|
|
exposure times) at each position. For 24um, repeat test using 3,10,and 30 secs |
|
|
|
|
|
|
|
|
|
as the basic exposure. For 70 and 160um, repeat test using the 3 and 10 sec |
|
|
|
|
|
|
|
|
|
exposures. |
|
|
|
|
|
|
|
|
|
Use the photometry/superreolution AOT. |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
III. Throughput in Superresolution Mode |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Switch 70um module to fine plate scale. Take data in a 2x2 dither pattern |
|
|
|
|
|
|
|
|
|
with an expsure time of 200 secs. Repeat using each of the base integration |
|
|
|
|
|
|
|
|
|
times of 3 and 10 sec. |
|
|
|
|
|
|
|
|
|
Use the photometry/superresolution AOT. |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
IV. Throughput in SED Mode |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Place star near one end of the SED slit. Take a series of exposures totalling |
|
|
|
|
|
|
|
|
|
150 secs at each of five positions along the slit. Repeat for each of the basic |
|
|
|
|
|
|
|
|
|
integration times (3 and 10 secs). |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|