IOC-MIPS_261a |
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10520C,10540C,10570C |
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Title: |
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MIPS Read Noise and Dark Current and Stability of Read Noise and Dark Current |
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Second Measurement |
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Objective: |
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Measure the read noise in each MIPS mode and check its stability over a week timescale. |
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The dark current will be measured using the same data set. |
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Description: |
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For each array, the scan mirror must be moved to the dark position before beginning the test. |
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including flow / state diagram |
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The entire pattern should be repeated one day and one week after the initial test. |
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This template is the second execution of the test and should occur 1 day after the first. |
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Part 1: |
1) Read noise test on the 24um array: |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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100 repeats of the 30-second mode. |
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Part 2: |
2) Read noise test on the 70um array: |
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Perform a thermal anneal on the array. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Switch scan mirror to other 70um dark position. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Perform a thermal anneal on the array. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Switch scan mirror to other 70um dark position. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Wait 2 hrs (other observing including programs using this array can occur). |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Switch scan mirror to other 70um dark position. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Perform a thermal anneal on the array. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Switch scan mirror to other 70um dark position. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Wait 4hrs (other observing can again proceed). |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Switch scan mirror to other 70um dark position. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Perform a thermal anneal on the array. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Switch scan mirror to other 70um dark position. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Part 3: |
3) Read noise test on the 160um array. |
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Perform a thermal anneal on the array. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Perform a thermal anneal on the array. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Wait 2 hrs (other observing including programs using this array can occur). |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Perform a thermal anneal on the array. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Wait 4hrs (other observing can again proceed). |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Perform a thermal anneal on the array. |
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100 repeats of the 3-second mode. |
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100 repeats of the 10-second mode. |
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Place in Schedule: |
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(relative to water shed events) |
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CTA and instrument must be at 5.5K. |
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Required Conditions: |
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Telescope must be pointed at a low sky background region as judged from IRAS data (if |
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the scattered light test as a function of telescope temperature indicates that MIPS is extremely dark, |
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then this requirement as well as the telescope temp. req. could be relaxed.) |
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This test should occur after the detector bias test and after the detector operating temperature test. |
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This test should occurr one day after the first read noise stability test. |
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Resources: |
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duration (best estimate) |
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9hrs |
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real time downlink (Y / N) |
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No |
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special post event actions (Y / N) |
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No |
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Generates 3900 DCEs. |
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Outcome: |
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description |
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The lowest possible dark current will be known along with stability and anneal patterns. |
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can proceed in parallel with other activity |
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Yes, if pointing at low sky background areas |
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must outcome be confirmed before next event / test /activity |
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No |
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method of confirmation (sensor TLM, data analysis, etc.) |
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data analysis |
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estimate of data turn around if required for confirmation |
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N/A |
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Unique or included in planned AOT? |
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Use the IER planned for anneals and darks. |
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Contingency Plan: |
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"What if..." |
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Only contingency here would involve repeating the test to explore more anneal timings. |
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IOC Critical |
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Y |
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References: |
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Template last updated: |
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9/7/99 |
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M. Rieke |
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