IOC-MIPS_280a |
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10870C,10760C,10770C,10530C |
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Title: |
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MIPS Super Resolution of the SVS-13 Source in the HH 7-11 Region |
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Note: |
This region has very bright IR sources -- this test can investigate how much of an impact there will be in an AOR. |
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Objective: |
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Verify scientific validity of MIPS Photometry pipeline products and ERO |
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Description: |
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Acquire normal photometry observations of an outflow region using the MIPS Photometry AOT |
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in the Large Field mode. |
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3s @ 24 microns (20 cycles), 3s @ 70 and 160 microns (20 cycles each), |
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large field, fine scale @ 70 microns. |
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Can be the same as: |
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Evaluate fully supported AOTs (MIPS Photometry/SR) |
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ERO: Press release observation |
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Place in Schedule: |
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After aperture door open |
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After CTA/instrument cool down and all other instrument testing is complete. |
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For 160um, the backgrd radiance must be less than 5.4E-13 W/cm2/sr (< 6 - 7 K). |
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After Photometry AOT functionality testing is complete. |
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Can be concurrent with other AOT/instrument tests. |
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Required Conditions: |
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CTA and instrument at nominal operating temperature for 160 micron band (mirror at 6 K). |
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PCS performance: nominal pointing and offsetting |
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Resources: |
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duration (best estimate) |
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1 hr |
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real time downlink (Y / N) |
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No |
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special post event actions (Y / N) |
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No |
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Outcome: |
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description |
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Fully calibrated MIPS Photometry data products in three bands. |
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can proceed in parallel with other activity |
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No - dedicated observing |
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must outcome be confirmed before next event / test /activity |
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No |
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method of confirmation (sensor TLM, data analysis, etc.) |
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Data analysis |
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estimate of data turn around if required for confirmation |
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48 hrs |
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Unique or included in planned uplink or downlink/analysis tool |
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Standard pipeline system and standard data analysis tools required. |
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MIPS Photometry/SR AOT required for uplink. |
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Contingency Plan: |
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Revisit pipeline and/or AOT design depending on the nature of failure. |
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"What if..." |
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IOC Critical |
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No |
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References: |
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Template last updated: |
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6-Sep-99 |
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Template written by: |
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William B. Latter |
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