| IOC-MIPS_255a | 10520C,10600C,10700C | ||||||||
| Title: | MIPS Radiometry tests: Sensitivity and Stability, both point sources and extended sources | ||||||||
| Objective: | Determine the sensitivity to both point and extended sources and check the stability over a week time scale. | ||||||||
| Description: | |||||||||
| including flow / state diagram | For each module two different celestial standards will be observed, one a calibrator star and | ||||||||
| the other a moderately high surface brightness extended source (will choose objects from IRAS or ISO programs). | |||||||||
| At 24 and 70 microns a nominal sensitivity of 100:1 will be achieved will at | |||||||||
| 160um at least 10:1 will be achieved. The observed fluxes will be compared to | |||||||||
| the modelled throughput of MIPS and will be used to update subsequent | |||||||||
| estimates of sensitivity and integration times required . | |||||||||
| After this test has executed once, it must be repeated again approximately one day and one week later | |||||||||
| See attached page for listing of events | |||||||||
| Place in Schedule: | |||||||||
| (relative to water shed events) | CTA and instrument must be at 5.5K. | ||||||||
| Required Conditions: | Basic instrument functionality must be confirmed. | ||||||||
| MIPS throughput test must already be done. | |||||||||
| Resources: | |||||||||
| duration (best estimate) | 12 hrs | (split into 6 2-hr sessions, 2 hr on pt. source, 2 hrs on extended, | |||||||
| repeat pattern for a total of three executions) | |||||||||
| real time downlink (Y / N) | No | ||||||||
| special post event actions (Y / N) | No | ||||||||
| Outcome: | |||||||||
| description | Final sensitivities will be available after the read noise test performed | ||||||||
| limited stability information will be available. | |||||||||
| can proceed in parallel with other activity | No, dedicated observing | ||||||||
| must outcome be confirmed before next event / test /activity | No | ||||||||
| method of confirmation (sensor TLM, data analysis, etc.) | data analysis | ||||||||
| estimate of data turn around if required for confirmation | N/A | ||||||||
| Unique or included in planned AOT? | |||||||||
| Uses standard AOTs but with non-standard pipeline processing as calibration data will be derived from this test. | |||||||||
| Contingency Plan: | |||||||||
| "What if..." | If test fails for any reason or if repeatability is worse than ~10%, test must be repeated to understand why. | ||||||||
| IOC Critical | Y | ||||||||
| References: | |||||||||
| Template last updated: | 27-Jul-98 | M. Rieke | |||||||
| Events: | (Same as list for Throughput test, note that this sequence must be repeated for both the | ||||||||
| point source and the extended source and the entire pattern will be done three times a day and a week apart). | |||||||||
| I. Throughput in Scan Map mode | |||||||||
| Make scan maps at each scan rate (slow,medium,fast) such that the star | |||||||||
| traverses each array. Repeat as needed to get 50 secs of exposure on the star. | |||||||||
| Use the scan map AOT. | |||||||||
| II. Throughput in Photometry mode | |||||||||
| Place star on each array (24um,70um,160um) in turn. Take data in a 2x2 | |||||||||
| dither pattern on each array with 50secs (or nearest larger number given allowed | |||||||||
| exposure times) at each position. For 24um, repeat test using 3,10,and 30 secs | |||||||||
| as the basic exposure. For 70 and 160um, repeat test using the 3 and 10 sec | |||||||||
| exposures. | |||||||||
| Use the photometry/superreolution AOT. | |||||||||
| III. Throughput in Superresolution Mode | |||||||||
| Switch 70um module to fine plate scale. Take data in a 2x2 dither pattern | |||||||||
| with an expsure time of 200 secs. Repeat using each of the base integration | |||||||||
| times of 3 and 10 sec. | |||||||||
| Use the photometry/superresolution AOT. | |||||||||
| IV. Throughput in SED Mode | |||||||||
| Place star near one end of the SED slit. Take a series of exposures totalling | |||||||||
| 150 secs at each of five positions along the slit. Repeat for each of the basic | |||||||||
| integration times (3 and 10 secs). | |||||||||