| IOC-MIPS_260a | 10520C,10540C,10570C | ||||||||
| Title: | MIPS Read Noise and Dark Current and Stability of Read Noise and Dark Current | ||||||||
| First Measurement | |||||||||
| Objective: | Measure the read noise in each MIPS mode and check its stability over a week timescale. | ||||||||
| The dark current will be measured using the same data set. | |||||||||
| Description: | For each array, the scan mirror must be moved to the dark position before beginning the test. | ||||||||
| including flow / state diagram | The entire pattern should be repeated one day and one week after the initial test. | ||||||||
| This template is the first execution of the test. | |||||||||
| Part 1: | 1) Read noise test on the 24um array: | ||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| 100 repeats of the 30-second mode. | |||||||||
| Part 2: | 2) Read noise test on the 70um array: | ||||||||
| Perform a thermal anneal on the array. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Switch scan mirror to other 70um dark position. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Perform a thermal anneal on the array. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Switch scan mirror to other 70um dark position. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Wait 2 hrs (other observing including programs using this array can occur). | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Switch scan mirror to other 70um dark position. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Perform a thermal anneal on the array. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Switch scan mirror to other 70um dark position. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Wait 4hrs (other observing can again proceed). | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Switch scan mirror to other 70um dark position. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Perform a thermal anneal on the array. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Switch scan mirror to other 70um dark position. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Part 3: | 3) Read noise test on the 160um array. | ||||||||
| Perform a thermal anneal on the array. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Perform a thermal anneal on the array. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Wait 2 hrs (other observing including programs using this array can occur). | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Perform a thermal anneal on the array. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Wait 4hrs (other observing can again proceed). | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Perform a thermal anneal on the array. | |||||||||
| 100 repeats of the 3-second mode. | |||||||||
| 100 repeats of the 10-second mode. | |||||||||
| Place in Schedule: | |||||||||
| (relative to water shed events) | CTA and instrument must be at 5.5K. | ||||||||
| Required Conditions: | Telescope must be pointed at a low sky background region as judged from IRAS data (if | ||||||||
| the scattered light test as a function of telescope temperature indicates that MIPS is extremely dark, | |||||||||
| then this requirement as well as the telescope temp. req. could be relaxed.) | |||||||||
| This test should occur after the detector bias test and after the detector operating temperature test. | |||||||||
| Resources: | |||||||||
| duration (best estimate) | 9hrs | ||||||||
| real time downlink (Y / N) | No | ||||||||
| special post event actions (Y / N) | No | ||||||||
| Generates 3900 DCEs. | |||||||||
| Outcome: | |||||||||
| description | The lowest possible dark current will be known along with stability and anneal patterns. | ||||||||
| can proceed in parallel with other activity | Yes, if pointing at low sky background areas | ||||||||
| must outcome be confirmed before next event / test /activity | No | ||||||||
| method of confirmation (sensor TLM, data analysis, etc.) | data analysis | ||||||||
| estimate of data turn around if required for confirmation | N/A | ||||||||
| Unique or included in planned AOT? | |||||||||
| Use the IER planned for anneals and darks. | |||||||||
| Contingency Plan: | |||||||||
| "What if..." | Only contingency here would involve repeating the test to explore more anneal timings. | ||||||||
| IOC Critical | Y | ||||||||
| References: | |||||||||
| Template last updated: | 9/7/99 | ||||||||
| M. Rieke | |||||||||