| IOC-MIPS_261a | 10520C,10540C,10570C | |||||||||
| Title: | MIPS Read Noise and Dark Current and Stability of Read Noise and Dark Current | |||||||||
| Second Measurement | ||||||||||
| Objective: | Measure the read noise in each MIPS mode and check its stability over a week timescale. | |||||||||
| The dark current will be measured using the same data set. | ||||||||||
| Description: | For each array, the scan mirror must be moved to the dark position before beginning the test. | |||||||||
| including flow / state diagram | The entire pattern should be repeated one day and one week after the initial test. | |||||||||
| This template is the second execution of the test and should occur 1 day after the first. | ||||||||||
| Part 1: | 1) Read noise test on the 24um array: | |||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| 100 repeats of the 30-second mode. | ||||||||||
| Part 2: | 2) Read noise test on the 70um array: | |||||||||
| Perform a thermal anneal on the array. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Switch scan mirror to other 70um dark position. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Perform a thermal anneal on the array. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Switch scan mirror to other 70um dark position. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Wait 2 hrs (other observing including programs using this array can occur). | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Switch scan mirror to other 70um dark position. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Perform a thermal anneal on the array. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Switch scan mirror to other 70um dark position. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Wait 4hrs (other observing can again proceed). | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Switch scan mirror to other 70um dark position. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Perform a thermal anneal on the array. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Switch scan mirror to other 70um dark position. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Part 3: | 3) Read noise test on the 160um array. | |||||||||
| Perform a thermal anneal on the array. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Perform a thermal anneal on the array. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Wait 2 hrs (other observing including programs using this array can occur). | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Perform a thermal anneal on the array. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Wait 4hrs (other observing can again proceed). | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Perform a thermal anneal on the array. | ||||||||||
| 100 repeats of the 3-second mode. | ||||||||||
| 100 repeats of the 10-second mode. | ||||||||||
| Place in Schedule: | ||||||||||
| (relative to water shed events) | CTA and instrument must be at 5.5K. | |||||||||
| Required Conditions: | Telescope must be pointed at a low sky background region as judged from IRAS data (if | |||||||||
| the scattered light test as a function of telescope temperature indicates that MIPS is extremely dark, | ||||||||||
| then this requirement as well as the telescope temp. req. could be relaxed.) | ||||||||||
| This test should occur after the detector bias test and after the detector operating temperature test. | ||||||||||
| This test should occurr one day after the first read noise stability test. | ||||||||||
| Resources: | ||||||||||
| duration (best estimate) | 9hrs | |||||||||
| real time downlink (Y / N) | No | |||||||||
| special post event actions (Y / N) | No | |||||||||
| Generates 3900 DCEs. | ||||||||||
| Outcome: | ||||||||||
| description | The lowest possible dark current will be known along with stability and anneal patterns. | |||||||||
| can proceed in parallel with other activity | Yes, if pointing at low sky background areas | |||||||||
| must outcome be confirmed before next event / test /activity | No | |||||||||
| method of confirmation (sensor TLM, data analysis, etc.) | data analysis | |||||||||
| estimate of data turn around if required for confirmation | N/A | |||||||||
| Unique or included in planned AOT? | ||||||||||
| Use the IER planned for anneals and darks. | ||||||||||
| Contingency Plan: | ||||||||||
| "What if..." | Only contingency here would involve repeating the test to explore more anneal timings. | |||||||||
| IOC Critical | Y | |||||||||
| References: | ||||||||||
| Template last updated: | 9/7/99 | |||||||||
| M. Rieke | ||||||||||