| CAID: MIPS-110 | Title: 24um On-board Data Processing Algorithms | |
| System: MIPS | Principal: dlp | Deputy: dfrayer, SStolovy |
| Objective: | Confirm that the linear regression fits to 24um array data are computed correctly. (Note that this should essentially be a repeat of a CTA test where the linear regression will also be checked) |
| Description: | This task has two basic parts: (1) 24 micron on-board slope calculation: The Si stimulator will be observed in each of the 3, 10, and 30 second exposure modes (20 DCEs each). The observing pattern will need to be executed both using the "raw" data mode where all 24um readout are sent to the ground and the normal "SUR" mode where only the linear regression of the ramp slope is returned. (2) 70 um and 160 um Ge on-board coaddition of samples. This has been split into MIPS-111, 112. A star will be observed in each of the 3 and 10 second exposure modes for one small field photometry cycle at 70 and 160 um. The observing pattern will need to be executed for the following values of the "Coadd" parameter in CEMIPSUR: NO_COADD, TWO, FOUR, EIGHT. |
| Day: 31.8486111111124 | Suggested Order: D200 | ||
| Must be preceded by these activities (list by CAID): MIPS-100 | |||
| Place in Schedule: This test must be done after the aperture door has opened and first light is confirmed for MIPS. The Si (24 micron) slope fitting test can be performed whenever the Si:As dynamic range is sufficient to observe the target stim for 30 seconds without saturation. The telescope temperature should be less than about 35 K(?). The test may take longer than calculated due to the need to adjust the Si stim brightness (a patchable constant). The second part (MIPS-111, 112) , which tests Ge coaddition, cannot be done above 5.5K unless the 70 micron check is decoupled from the 160 micron check. | |||
| Priority: Critical | |||
Conditions | |||
| Maximum telescope temperature: | 33 K | ||
| Minimum telescope temperature: | 5.5 K | ||
| Should activity be repeated if focus changes? | No Repeat if focus changes by 0 mm | ||
| Maximum absolute pointing uncertainty: | 60 arcsec (1 sigma radial) | ||
| Maximum precision offset uncertainty: | 60 arcsec (1 sigma radial) | ||
| Observatory configuration: | standard | ||
| Go/No Go criteria: | CE power must be available. MIPS must be detecting light and not saturating on the stim with a 30 second exposure. | ||
Duration: 33 minutes
| | Real time downlink:
No | | |||
| Data Volume (uncompressed): 1223 Mbits | |||
| List Blocks, AORs, SERs, IERs, or unique sequences required (uplink): IER which directs CSMM to dark position and takes 20 RAW and SUR images at exposure times of 4, 10, and 30 seconds; done 11/13/01 as m110_ier.exp | |||
| List Analysis tools required (downlink): Image analysis software to compare on-board image calculations with identical calculations by groundbased software. Code to replicate on-board image calculations. | |||
| Estimate of data turn around: 5 hours | |||
| Description: Ground reduction of raw data needs to be compared with on-board results. | |||
| Can proceed in parallel with other activity: Yes | |||
| Must outcome be confirmed before next activity: Yes | |||
| Method of Confirmation: Data analysis | |||
| Success criteria: Data are obtained and unsaturated. SUR algorithms match expectations. | |||
| Contingency plan: If ground calculation does not match on-board results, then the flight code will have to be examined, the bug corrected, and a new flight software image uploaded. The Si algorithm is crucial to the MIPS data-taking strategy. If it fails, a backup strategy would severely limit the amount of 24 micron data which can be obtained during one observation. This might well obviate the Scan AOT. The Ge coaddition capability is non-critical and would not impact the mission. | |||
Comments | |||
| References: | |||
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Additional Comments:
Required Conditions: Background at 24um must be less than 7x10^-5 watts/m^2/sr. T<45K Must be able to place a star within the 5'x5' FOV Generates 84 DCEs for Si part (assuming each "raw" is one DCE) and 160 DCEs for Ge part | |||
| This activity last updated: 4/19/2002 10:23:46 AM | |||