| CAID: MIPS-220 | Title: Slew State Validation | |
| System: MIPS | Principal: alberto | Deputy: SStolovy |
| Objective: | Verify that the baseline slew state for MIPS works and does what is planned. *And to check the state of the detectors after slewing through a bright source* |
| Description: | * During slews (long ones, between AORs) the CSMM is placed in the neutral position (all three arrays see sky), and the instrument is resetting the arrays every 0.5 MIPS second. * In general we do not know the slew paths that will be taken between AORs prior to final scheduling. Question - Does the possibility of slewing over very bright sources have a potential of impacting the following AORs with residual images? Of particular concern to the 24 micron data. Task - Do PH/SR AOR of known source in all three bands. A calibration source would work great, but might be hard to find one that meets that needs. Chain another PH/SR AOR of a source or region that is relatively nearby, and will force the slew between AORs to go over a region of very bright IR sources (Orion for example). Repeat. If there appear no ill effects on the following AORs, then there is no need to change the instrument state for slewing. If we do bad things, then it is possible we will need to consider putting the 24 micron array in the dark for slewing. The disadvantage is increased uplink command load, that is already too large, for reconfiguring the CSMM, and this is a large CSMM through from neutral following every AOR - a lifetime worry. All that is needed are two or four standard PH/SR AORs (about 10 minutes each, max), chained so that they slew over very bright sources. Data analysis tools are standard ones. Turnaround of data analysis should be relatively quick - maybe 6 hours. IOC Critical. |
| Day: 61.7694444444496 | Suggested Order: O800 | ||
| Must be preceded by these activities (list by CAID): MIPS-246 | |||
| Place in Schedule: After aperture door open. After CTA/instrument cool down: For 24um, the backgrd radiance must be less than 1.0E-11 W/cm2/sr (< 30K). For 70um, the backgrd radiance must be less than 1.0E-12 W/cm2/sr (< 12 K). For 160um, the backgrd radiance must be less than 5.4E-13 W/cm2/sr (< 6 K). It may be possible to split this test into parts executed a different times based on telescope temperature, but mapping in all three bands is optimal use of time. Basic instrument commanding and functionality must have been confirmed. After initial Phot/SR AOT testing is complete. Before final operational parameters are set and instrument tuning complete. | |||
| Priority: Necessary | |||
Conditions | |||
| Maximum telescope temperature: | 6.5 K | ||
| Minimum telescope temperature: | 5.5 K | ||
| Should activity be repeated if focus changes? | No Repeat if focus changes by 0 mm | ||
| Maximum absolute pointing uncertainty: | 3 arcsec (1 sigma radial) | ||
| Maximum precision offset uncertainty: | 3 arcsec (1 sigma radial) | ||
| Observatory configuration: | |||
| Go/No Go criteria: | |||
Duration: 45 minutes
| | Real time downlink:
No | | |||
| Data Volume (uncompressed): 80 Mbits | |||
| List Blocks, AORs, SERs, IERs, or unique sequences required (uplink): Standard pipeline and data analysis tools. MIPS Pht/SR AOTs required | |||
| List Analysis tools required (downlink): | |||
| Estimate of data turn around: 0 hours | |||
| Description: Several Phot/SR AOTs will be executed. Standard data produces will result. * A more efficient way is to use scan mapping, going from a dark region, through a bright source and back, exactly in the same way*. | |||
| Can proceed in parallel with other activity: No | |||
| Must outcome be confirmed before next activity: No | |||
| Method of Confirmation: Data analysis, standar IRAF or IDL software tools. | |||
| Success criteria: If there appear no ill effects on the following AORs, then there is no need to change the instrument state for slewing. | |||
| Contingency plan: Revisit instrument state during slews. Consider different reset rates, or other options. One possibility is to place the 24um array in the dark while slewing. | |||
Comments | |||
| References: | |||
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Additional Comments:
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| This activity last updated: 10/22/2002 7:08:58 PM | |||