MIPS Campaign Shutdown Activities, Si only

Principal: dmkelly
Deputy: cengelbracht
Data Monkey(s): Can I list Bill Latter as a data monkey?
Priority: Necessary
Downlink Priority: Normal
Analysis Time: 24h
Last Updated:

Objective

Perform a standard set of MIPS tasks before turning off the instrument.

Description

1) Take 10 4s RAW exposures 
2) Perform thermal anneal on the Si array
3) Take 10 4s RAW exposures 
4) Transition from MIPS_OBSERVE to OFF
5) Turn off power to the combined electronics

Data Collected

For the pre-anneal and post-anneal exposures:  mips_raw_C0F2N10
Diagnostic data will be collected during the thermal anneals.
For the 24um anneal, 160 samples will be collected on 1s intervals.
The items are:
  1. D24TmpA      2. D24TmpB     3. D160TmpA     4. D24AnnealCur  5. D70TmpA
  6. D160JnctTmp  7. D70BaseTmp  8. D160BaseTmp  9. D160StimTmp  10. CSMMTmp


# pre-anneal exposure
MIPS_MOBS_PHOT
sendcmd CEGESTIM '"AUTO",63,"BOTHOFF","BOTHOFF","BOTHOFF",10,10,"MIPS"'
sendcmd CEGERSTCON '10,127,4,"MIPS"'
sendcmd CESCANCON '"CHOP","REV",0,2048,2048,0,511,"MIPS"'
# collect 10 4s RAWs
sendcmd CEMIPSRAW  'AORID_upper,AORID_lower,0,"NO_COADD",2,10,"MIPS"'
MIPS_BACKTO_MOBS
# Thermal anneals on Si array
  ColDiag_24TMP_MIPS
    Si_Anneal_Heat_MIPSA_MIPS
  CEDumpDiag
# post-anneal exposure
MIPS_MOBS_PHOT
sendcmd CEGESTIM '"AUTO",63,"BOTHOFF","BOTHOFF","BOTHOFF",10,10,"MIPS"'
sendcmd CEGERSTCON '10,127,4,"MIPS"'
sendcmd CESCANCON '"CHOP","REV",0,2048,2048,0,511,"MIPS"'
# collect 10 4s RAWs
sendcmd CEMIPSRAW  'AORID_upper,AORID_lower,0,"NO_COADD",2,10,"MIPS"'
MIPS_BACKTO_MOBS
# power off the instrument
mips_off
# power off the CE
CE_off

Data Reformatting Requirements

Array Data Desired:

CECOLDIAG data from the anneals -- converted into spreadsheet format All Array data for the pre-anneal and post-anneal exposures

Data Reformatting Option:

Special Instructions:






Task Dependencies






Calibration Dependencies






Output and Deliverable Products

We will generate plots of temperature versus time for the
thermal anneal.  We will record the maximum temperatures 
and maintain these results in a database.  Relevant ancillary 
data (TBD) will also be entered in the database.  We might
also perform fits to the temperature profiles and include fit 
coefficients in the database.  We will average the 24um data 
collected after the anneal and divide that image by the average 
of the 3 DCEs collected before the anneal.  We will be looking 
for responsivity changes, changes in the ramp offset levels,
 and for changes in pixel behavior.



Data Analysis


Step-by-step analysis:
1) Obtain the diagnostic data.  This seemingly obvious step is called
   out because these data might not be delivered with the usual science data.
   They will not go through tranhead, nor through the SSC pipeline.  The
   hope is that the SSC will develop a tool for generating spreadsheets
   and plots from diagnostic data.
2) Generate plots of temperature versus time for each of the temperatures.
   If done in Excel, a template file should be generated such that all 
   one has to do is paste in the data and then the plots are generated
   automatically.  One can also develop an IDL or PGPerl script to do this.
3) Determine the maximum temperature reached on each array during its
   anneal and enter these values into a database.  Maintain plots of
   these items versus execution day and time so that long-term trending
   can be performed.
4) If desired, perform fits to the temperature profiles and enter the
   fit coefficients into the database.
5) Check for changes in the long-term thermal behavior of the arrays 
   during anneals.  If present, assemble ancillary data (TBD) that 
   affects the anneal temperatures and look for trends.  This step
   will likely involve keeping the data from all IOC thermal anneals
   in a master spreadsheet, with coadding to produce master temperature
   plots and with overplotting to compare the most recent anneal with
   the master anneal temperature curves.
6) Average the 24um data collected after ther thermal anneal.  Also
   average the 3 DCEs collected before the 24um anneal.  Determine 
   median ramp starting points for these two images.  If there are
   changes, subtract the first frame of one from the other to see
   if the offsets are uniform across the array.
7) Divide the 24um post-anneal image by the pre-anneal image.  Record
   the responsivity change and make notes on changes in pixel behavior.





Software Requirements







Actions Following Analysis

Check for the long-term stability of the anneal temperatures.
If there are drifts, determine the cause of the drifts and take 
action if necessary.  Record the 24um responsivity and offset
level changes that resulted from the thermal anneal and as 
best as possible make an assessment of the effectiveness of the
anneal and of the need for more frequent 24um anneals.




Failure Modes and Responses

There are several possible failures.  If the anneal failed to happen,
we need to determine whether there was a scripting problem and get it
fixed.  We also need to inspect the subsequent data and see if it is
usable.  The data might need to be flagged for special handling, but
probably not since the offset drifts are pretty minimal.  If the heater
failed, we need to assess whether a CE side swap is warranted.  If the
array did not reach the desired temperature, we need to check that
the anneal duration and current were as planned, and we need to assess
whether thermal conductances have changed since ground testing.  If the
CECOLDIAG data are corrupted, we need to determine first and foremost
whether the anneal happened, and then we can check for scripting errors.



Additional Notes