Principal: Douglas Kelly Deputy: Alberto Noriega-Crespo Analyst: Douglas Kelly AORKEYS: 010,015,950,090 Last Updated: 9/15/03
A set of EZqueries was performed on MIPS telemetry from Campaign A. The following is a thorough summary of the results. Telemetry plots have been generated for all telemetry items that changed during the test. A list of anomalies is presented in the Conclusions section. The general conclusion from the telemetry is that all MIPS functions are behaving properly. Once we get to nominal operating conditions, I will repeat this analysis to generate the flight-truth set of reference telemetry values.
A set of four EZQueries were performed on the data from campaign A. Due to operator error, the queries were performed with ERT sorting. The proper use of EZQueries in flight operations is to use SCET rather than ERT. As a result of this improper usage, some anomalous telemetry results were obtained. These usually took the form of a telemetry channel appearing to be stale for quite a long time after the channel actually changed, or a channel bouncing back and forth between two states when the telemetry item actually stayed stable. Another round of queries will be performed following campaign D1, so the Campaign A queries were not repeated with the proper query files. The queries are as follows:
The queries spanned the time from power-up through when MIPS was transitioned back to OPERATE mode. A few telemetry items were queried over a longer timespan, covering the time when the CE was left idling in OPERATE mode.
The queries produce a set of ecsv files. These data were examined using IDL tools developed by Alberto Noriega-Crespo. The tools are as follows:
The IDL files used to read in the ecsv files and to generate the data plots are as follows. Note that these files were not made into stand-alone programs; I always cut and paste out of them onto the IDL command line. The plot parameters were tailored specifically for the data from this campaign and so would need to be adjusted to be appropriate for all campaigns.
T0_Ops = 2003-245T01:21:43.234 StatusTime = OpsTime AllElseTime = OpsTime QuickTime = OpsTime + 1194
Ops Quick
Time Time Activity
-9 1185 CE turnon IER started
20 1214 Opr_Boot
284 1478 Boot_Opr
671 1865 MIPS turnon IER started
692 1886 MIPS_Opr_Mrdy
708 1902 D24 Heater Enabled
712 1906 Si Heater Monitor enabled
772 1966 MIPS_Mrdy_Mobs
786 1980 Memory Monitors set up
1104 2298 D24 Heater Disabled
1108 2302 Si Heater Monitor disabled
1136 2330 start Si Anneal
1244 2438 Si Anneal completed
1296 2490 D24 Heater Enabled
1300 2494 Si Heater Monitor enabled
2261 3455 start of MIPS-015
2268 3462 Start of Ge anneal diagnostic data collect
2273 3467 Start of D160 thermal anneal
2296 3490 Start of D70 thermal anneal
2352 3546 End of Ge anneal diagnostic data collect
2352 3546 start Si Anneal block, MIPS-015
2400 3594 D24 Heater Disabled
2404 3598 Si Heater Monitor disabled
2424 3618 Start of Si anneal diagnostic data collect
2436 3630 start Si Anneal
2540 3734 Si Anneal completed
2580 3774 End of Si anneal diagnostic data collect
2592 3786 D24 Heater Enabled
2596 3790 Si Heater Monitor enabled
2716 3910 Switch to Heater B
2721 3915 start Rail-to-Rail test
move to scanpos 101
2748 3942 start of Raw Exposure
2792 3986 end of Raw Exposure
2816 4010 start of SUR Exposure
2848 4042 end of SUR Exposure
2860 4054 start Processor Load test
3188 4382 end Processor Load test
3201 4395 start Compact Source Phot test, slew to target
move to scanpos 1
3596 4790 start 1st cycle
3620 4814 end 1st cycle
3652 4846 start 2nd cycle
3676 4870 end 2nd cycle
3684 4878 move to scanpos 0
3688 4882 end Compact Source Phot test
3696 4890 start mips-950
3860 5054 start Scattered Background Monitor test
3864 5058 move to scanpos 101
3868 5062 start of 1st 10x3s cycle, scanpos 101
4076 5270 end of 5th 10x3s cycle
4084 5278 move to scanpos 102
4096 5290 start of 1st 100 DCE cycle, scanpos 102
4460 5654 end of 1st cycle
4464 5658 move to scanpos 103
4484 5678 start of 2nd 100 DCE cycle, scanpos 103
4852 6046 end of 2nd cycle
4864 6058 move to scanpos 104
4876 6070 start of 3rd 100 DCE cycle, scanpos 104
5244 6438 end of 3rd cycle
5256 6450 end Scattered Background Monitor test
5264 6458 move to scanpos 0
5666 6860 start MIPS power-off IER
5676 6870 MIPS_Mobs_Mrdy
5744 6938 MIPS_Mrdy_Opr
----------------------------------------------------------------------------------------------------------------------------------------Scan mirror telemetry reference data
Scan mirror telemetry items for various observing modes (not very useful for scanmap housekeeping data due to aliasing): Relationship between relpos value (I-0302 or I-0303) and FinPos (I-0108): CE1: FinPos = 16405 + (2048-relpos)*7.989 = 32766 - relpos*7.989 CE2: FinPos = 16394 + (2048-relpos)*7.989 = 32755 - relpos*7.989 PosIndex CrsPos1 RmpStrt1 RmpStrt2 StepCmd FinPos CrsPos CE Mode I-0305 I-172 I-302 I-303 I-0304 I-0108 I-0109 0 1949 2048 2048 0 16405 17197 1 Initial/MIPS OBS 16394 17183 2 1 2007 2048 2048 0 16405 16734 1 PHOTO/SCAN 16395 16719 2 101 690 2048 2048 0 16405 27256 1 24um Dark 16394 27243 2 (darks, 24lin) 102 2825 2048 2048 0 16414 10198 1 70um Dark(darks) 16402 10183 2 104 3210 2048 2048 0 16422 7122 1 160um Dark(darks) 16411 7103 2 41 3220 2048 2048 0 16424 7039 1 70um SED 16413 7029 2 61 875 2048 2048 0 16405 11503 1 70um NF PosIndex RmpStrt1 RmpStrt2 StepCmd FinPos CrsPos 24um small/default: (CE1) 1 2048 3749 -79 (17036+n*1262)/( 4078+n*1262) 16734 24um large/default: (CE1) 1 2048 2180 -26 (16612+n*415) /(15765+n*415) 16734 160um small/default: (CE1) 1 2048 2601 -111 (17291+n*1774)/(13760+n*1774) 16734 160um large/default: (CE1) 1 3085 1011 0 13784 24689 16734 70um small/default: (CE1) 1 2048 3238 -238 (18306+n*3803)/(10700+n*3803) 16734 70um large/default: (CE1) 1 1940 3686 -170 (18625+n*2716)/( 6035+n*2716) 16734 1 2156 410 170 (14184-n*2716)/(26774-n*2716) 16734 70um small/fine: (CE1) 61 1271 3397 -52 (23027+n*831) /( 6458+n*831) 11503 61 2825 699 52 ( 9782-n*831) /(26351-n*831) 11503 70um large/fine: (CE1) (the same as 70um small/fine) 61 1271 3397 -52 (23027+n*831) /( 6458+n*831) 11503 61 2825 699 52 ( 9782-n*831) /(26351-n*831) 11503 Scanmap, Fast/Fwd: (CE1) 1 2048 2048 27 (16189-n*431) /(15973-n*431) 16734 Scanmap, Fast/Rev: (CE1) 1 2048 2048 -27 (16620+n*431) /(16836+n*431) 16734 Scanmap, Med/Fwd: (CE1) 1 2048 1827 18 (16261-n*288) /(17882-n*288) 16734 Scanmap, Med/Rev: (CE1) 1 2048 2269 -18 (16548+n*288) /(14927+n*288) 16734 Scanmap, Slow/Fwd: (CE1) 1 2048 1827 40 (16085-n*639) /(17531-n*639) 16734 Scanmap, Slow/Rev: (CE1) 1 2048 2269 -40 (16724+n*639) /(15278+n*639) 16734
The following is an item-by-item review of the telemetry from Campaign A. Telemetry plots are available for all items that exhibited changes during the campaign.
query.quick:
F-2060 ERT DN %d AORID_KEY
1185s AORID: 6411520 (0x61D500) CE_CE1_turnon
1610s 6411776 (0x61D600) CE_irs-mips_Patch_con_ier_cg
1865s 6412032 (0x61D700) mips_turnON
1980s 6412288 (0x61D800) mips_memmon
2640s 6412544 (0x61D900) mips_ier900
3455s 6412800 (0x61DA00) mips_ier015
3915s 6413056 (0x61DB00) mips_rail2rail
4395s 6413824 (0x61DE00) mips015__70umphtmy
4890s 6413312 (0x61DC00) MIPS_mip_ier950
6860s 6413568 (0x61DD00) mips_turnOFF
I-0310 ERT DN %d Number of DCEs in Exposure
Initialized to 0. Set to 10 at start of first Rail-to-rail exposure.
Set to 5 for Proc Load test. Set alternately to 1 and 7 for two cycles
of 70um phot test. Set to 10 for 24um portion of scattered background
monitor test. Set first to 1, then to 100 for the 70um and 160um
portions of the scattered background monitor test.
I-0061 ERT DN %d DCE_FrameCmd --
61--30s DCEs; 21--10s DCEs; 9--4s DCEs; 7--3s DCEs; 4--AutoReady mode.
Set to 9 for Raw exposures in Rail-to-rail test, and to 7 for SUR mode
observations. Set to 125 (62s DCEs) for Proc Load test. Set to 7 for
all other exposures. The telemetry value returns to 4 whenever we are
not taking data.
I-0108 (zoomed) ERT DN %d CSMM Fine Position DAC -- nominal value of 16405 +/- 1
for scanpos 0/1. The scatter is +/- 3 at the dark positions, with mean
values of 16402 at scanpos 101, 16410 at scanpos 102, 16404 at scanpos 103,
and 16418 at scanpos 104. The 70um photometry AOT gave finpos values of
8125, 12266, 16405, 20543, 24682, all with a scatter of +/- 1. These
numbers are a bit different from what I expected in my drylabbing.
I-0109 ERT DN %d CSMM Coarse Position DAC -- The observed values were
17195+/-2 at scanpos 0, 16732+/-2 at scanpos 1, 27254+/-1 at scanpos 101,
10197+/-1 at scanpos 102, 21573+/-1 at scanpos 103, 7120+/-3 at scanpos 104.
I-0305 ERT DN %d ScanPosIndex -- The nominal value was 0 between tests.
We moved to scanpos 101 for the rail-to-rail and proc load tests and
for part of the scattered background monitor test. We moved to scanpos 1
for the 70um phot test. We also moved to scanpos 102, 103, and 104 for
the scattered background test.
I-0304 ERT DN %d ScanStepCmd -- The nominal value was 0. The value
during the 70um phot test was set to -259. This is different than
my drylab value.
I-0312 ERT DN %d MIPSExpStat -- 3=RAW, 5=SUR, 4=NoExp.
Set to Raw during the first part of the rail-to-rail test, otherwise
set to SUR. This telemetry item only went to NoExp once, for one
telemetry read, between the 1 DCE and 100 DCE portions of the
scanpos 104 scattered background test.
I-0370 ERT DN %d SyncPulseCnt -- one increment per DCE
K-0290 ERT DN %d TotalErrors -- Set to default value of 0 at start
of CE power-on and never changed.
K-0288 ERT DN %d Last Error ID -- Set to default value of 0 at start
of CE power-on and never changed.
K-0289 ERT DN %d Last Error Parameter -- Set to default value of 0 at start
of CE power-on and never changed.
K-0279 ERT DN %d DiagColState -- 0=Idle, 1=InProgress, 2=DataReady (waiting
to be dumped). As expected, the telemetry went to InProgress during the
anneals of MIPS-900 and MIPS-015, to DataReady when the diagnostic was
completed, and then back to Idle after the diagnostic data were flushed.
K-0346 ERT DN %d SiAnnealEnbl -- Changes from disabled to enabled at the
start of the Si anneals in MIPS-900 (2330s) and MIPS-015 (3630s). I am
surprised that the telemetry value did not immediately jump back to
disabled when the anneals were over.
K-0366 ERT DN %d D24HtrEnCmd -- Switched off prior to the anneals, but
otherwise kept enabled throughout the test. Initially turned on during
the MIPS_MRdy_MObs state transition.
K-0384 ERT DN %d D24HtrMonEn -- Enabled during MIPS_MRdy_MObs state
transition. Turned off for Si anneals.
I-0362 ERT DN %d D24HtrSel -- This telemetry value defaults to 1 (HtrB)
when the heater is off and usually is set to 0 (HtrA) when the heater
is active, either for heater monitoring or for thermal anneals. We
set the heater to HtrB after the MIPS-015 thermal anneal and used
HtrB for the rest of the campaign.
I-0043 ERT DN %d D160AnHtrEn -- normally disabled, but switched to
enabled during the 160um thermal anneal.
I-0044 ERT DN %d D70AnHtrEn -- normally disabled, but switched to
enabled during the 70um thermal anneal.
K-0113 ERT DN %d CEState -- 1=Boot, 2=Operate, 9=MipsReady,
10=MipsObserve, 11=PhotoSuper, 12=ScanMap, 13=SED, 14=TotalPower,
15=Suspend
Set to photoSuper for Rail-to-Rail, CE Proc Load, Compact Source Phot,
and Scattered Light tests. Otherwise set to MIPS Observe except
during power-up and power-down.
query.ops:
K-0113 ERT DN %d CEState -- same as above
I-0311 ERT DN %d DCEs_ExpCnt -- 0-9 twice for Rail-to-Rail, 0-4 for
Proc Load, 0-5 twice for Compact Source Phot, 0-9 5x and 0-99 3x
for Scattered Background Monitor test
I-0078 ERT DN %d CalibCyclCmd -- set to 6 for 70um Compact Phot,
set to 33 for Scattered background, scanpos 102
set to 25 for Scattered background, scanpos 103
set to 11 for Scattered background, scanpos 104
Why were these Calib Cycles set differently like this??
I-0079 ERT DN %d CalibCyclCnt -- counts 0 -- N-1 on CalibCyclCmd (I-0078)
I-0076 ERT DN %d D70ResetPer -- set alternately to either 127 (no resets)
or 20 (10s resets).
I-0082 ERT DN %d D160ResetPer -- set alternately to either 127 (no resets)
or 10 (5s resets). If we want to verify that it is always set to 10
when we are taking science data, we should query the ancillary channel.
I-0072 ERT DN %d D70StimPer -- set to 10 (2.5s stim dur) at the start
of rail-to-rail test and never changed thereafter.
I-0073 ERT DN %d D160StimPer -- set to 10 (2.5s stim dur) at the start
of rail-to-rail test and never changed thereafter.
I-0313 ERT DN %d ExpGeCoadd -- set to 0 (noCoadd), 1 (coadd=2),
2 (coadd=4), or 3 (coadd=8). Was set to 0 at all times except during
the CE Proc Load test, when it was set to 3.
I-0020 ERT DN %d MIPS status word 1 (see below)
Expect 65344 + (0-1)*128 + (0-1)*32 + (0-8)
Nonsense values seen in Opr mode, during power up and power down.
Initialized to 65344 when ADC and Ge power turned on in OPR_RDY transition.
CSM Direction set at 3584s (start of 70um compact phot), status word
increases to 65376. Then toggles back and forth to 65380 during compact
phot test and scattered background monitor test, as D70FldA is toggled
on and off.
I-0040 ERT DN %d MIPS status word 2 (see below)
Expect 128 + (0-2)*16384 + (0-1)*2048 + (0-1)*1024 + (0-1)*64 +
(0-1)*16 (end of Exp) + (0-1)*8 (during Exp) + (0-1)*768 (Ge Qrst's)
This value changes too much to be useful. It would be better to
examine the ancillary data for some of the individual telemetry
items to see stim flashes, Qrst's, etc.
I-0081 ERT DN %d MIPS status word 7 (see below)
Expect 320 (5s 160um resets) or 4064 (D160reset=127) +
(0-1)*16 (CSM_Flyback) + (0-15) (errors)
I only saw 320, 336, 4064, and 4080. The 160um resets were
set to 5s whenever we were taking science data.
DN bits StatusWord1 StatusWord2 StatusWord7
1 1 D70FltA TestModeLock-Stim CSM_Rollover
2 2 D70FltB TestModeLock-ADC CSM_ScanErr
4 3 D70FldA ADC_TestMode HTG_CmdError
8 4 D70FldB SC_SyncEn ADC_BusyErr
16 5 CSM_IntegRst ReSynchObs CSM_Flyback
32 6 CSMDir D24BoostCmd D160ResetPer
64 7 CSM_CntrRelay D24ResetCmd "
128 8 RampMode CSM_PositEn "
256 9 CSM_DriveEn D160Qrst "
512 10 ADC_Mode D70Qrst "
1024 11 ADC_Status D160Flashed "
2048 12 ADC_Calib D70Flashed "
4096 13 ADC_Enabled D160HeaterOn ---
8192 14 D160PowerOn D70HeaterOn ---
16384 15 D70PowerOn D160StimB ---
32768 16 ADC_PowerOn D160StimA ---
I-0045 ERT DN %d Det 70um Stim Flashed -- flashes detected at various
times during 70um Phot and Scattered Light tests.
I-0046 ERT DN %d Det 160um Stim Flashed -- flashes detected at various
times during 70um Phot and Scattered Light tests.
I-0364 ERT DN %d D24StimEn -- 0=off, 1=StimA, 2=StimB
Set to 0 during MIPS_Opr_MRdy transition and then never changed.
I-0033 ERT DN %d D70StimEn -- 0=off, 1=FlatA, 2=FlatB, 4=FloodA, 8=FloodB
Registered as Off except during 70um Phot and Pos 102 and Pos 103 portions
of the Scattered Light test, when FloodA was on.
I-0041 ERT DN %d D160StimEn -- 0=off, 1=StimB, 2=StimA
Registered as Off except during 70um Phot and Pos 104 portion of the
Scattered light test, when StimA was on.
I-0123 ERT DN %d D70StimCur -- 26251 +/- 1, or 992.7 uA. The value was
26764 +/-2 in MOS testing, or 912.2 uA. The stim DAC in MOS testing
was 0x2F, and it was 0x33 in flight. The currents scale linearly
with DAC setting, i.e. (51/47)*912.2 = 990.
I-0125 ERT DN %d D160StimCur -- 24591 +/- 1, or 250.1 uA. The value was
25742+/-2 in MOS testing, or 214.9 uA. The stim DAC in MOS testing
was 0x37, and it was 0x40 in flight. The currents scale linearly
with DAC setting, i.e. (64/55)*214.9 = 250.1.
I-0069 ERT DN %d GeStimMode -- 0(Auto), or 1(Manual).
Set to 0 during MIPS_Opr_MRdy transition and then never changed.
I-0107 ERT DN %d CSMM Position Output --
For scanpos 0: 31080 +/- 40, plus numerous jumps to 31300
1: 32150 +/- 40
101: 8150 +/- 50
102: 47050 +/- 50
103: 21110 +/- 40
104: 54070 +/- 50
I-0110 ERT DN %d CSMM Current --
For scanpos 0: 32950 +/- 70, plus numerous jumps to 32630
32880 +/- 70 after Scattered Bkgd test
1: 33850 +/- 70, scatter of 1500 peak-to-peak
101: 17090 +/- 70, initial tail to 16820 before settling
102: 42780 +/-110
103: 26870 +/- 80
104: 48050 +/-110, initial tail to 48370 before settling
I-0300 ERT DN %d ScanCrsPos1 --
690 (pos 101) for Rail-to-Rail and Proc Load and part of Bkgd Monitor test
1949 (pos 0) between tests
2007 (pos 1) for Compact Source Phot test
2825 (pos 102) for part of Bkgd Monitor test
1401 (pos 103) for part of Bkgd Monitor test
3210 (pos 104) for part of Bkgd Monitor test
I-0301 ERT DN %d ScanCrsPos2 -- same as ScanCrsPos1 (I-0300)
I-0302 ERT DN %d ScanRmpStrt1 -- set to 2048 in MIPS_Opr_MRdy transition,
reset to 2307 for 70um compact phot test, then reset to 2048. I need
to update my parameters for the 70um compact source photometry AOR
because this is not the value I expected.
I-0029 ERT DN %d CSM_RampChop -- 0=Chop, 1=Ramp.
Set to 0 during MIPS_Opr_MRdy state transition and then never changed.
I-0031 ERT DN %d CSM_Directn -- 0=positive(Rev), 1=negative(Fwd)
Registered as Rev until the start of the 70um Phot test, then Fwd
thereafter.
I-0075 ERT DN %d CSM_SlopeCmd -- set to 511 when idle, 43 (fast scan),
111 (med scan), 274 (slow scan)
Set to 511 during rail-to-rail test, but otherwise unchanged.
K-0091 ERT DN %d Command Accept Counter -- Counts from 0-255; many
rollovers seen.
K-0090 ERT DN %d Command Received Counter -- Counts from 0-255; many
rollovers seen.
K-0093 ERT DN %d Command Response Counter -- Counts from 0-255; many
rollovers seen.
K-0092 ERT DN %d Command Reject Counter -- set to 0 in OFF_Boot transition
and then never changed.
K-0094 ERT DN %d Invalid Response Count -- set to 0 in OFF_Boot transition
and then never changed.
K-0261 ERT DN %d Command Abort in Progress -- set to 0 in OFF_Boot transition
and then never changed.
K-0114 ERT DN %d Old Error ID 1 -- set to 0 in OFF_Boot transition
and then never changed.
K-0115 ERT DN %d Old Error Parameter 1 -- set to 0 in OFF_Boot transition
and then never changed.
K-0116 ERT DN %d Old Error ID 2 -- set to 0 in OFF_Boot transition
and then never changed.
K-0117 ERT DN %d Old Error Parameter 2 -- set to 0 in OFF_Boot transition
and then never changed.
K-0118 ERT DN %d Old Error ID 3 -- set to 0 in OFF_Boot transition
and then never changed.
K-0119 ERT DN %d Old Error Parameter 3 -- set to 0 in OFF_Boot transition
and then never changed.
K-0120 ERT DN %d Old Error ID 4 -- set to 0 in OFF_Boot transition
and then never changed.
K-0121 ERT DN %d Old Error Parameter 4 -- set to 0 in OFF_Boot transition
and then never changed.
K-0258 ERT DN %d LimViolation -- set to 0 in OFF_Boot transition
and then never changed.
I-0317 ERT DN %d CSM_OOLCnt -- set to 0 in MIPS_Opr_MRdy transition
and then never changed.
K-0281 ERT DN %d Diagnostic Data Collection Exp. Cnt -- Increments by one
each time a diagnostic data collection is started. In this test, incremented
for MIPS-900 (Si), MIPS-015 (Si), and MIPS-015 (Ge) anneal sequences.
K-0016 ERT DN %d TlmCSMode -- 1=Boot, 2=Operate, 8=MIPS
Changed as expected in OFF_Boot, Boot_Opr, Opr_Rdy, and Rdy_Opr transitions.
K-1010 ERT DN %d FltSWMode -- 1=Boot, 2=Operate, 8=MIPS
Changed as expected in OFF_Boot, Boot_Opr, Opr_Rdy, and Rdy_Opr transitions.
I-0055 ERT DN %d TestModeLock -- set to 0 in MIPS_Opr_MRdy transition and
then never changed.
K-0322 ERT DN %d D24PwrEnCmd -- 0=disabled, 1=enabled
Enabled in MIPS_MRdy_Obs transition, disabled at MIPS_MObs_Rdy transition.
I-0022 ERT DN %d D70PowerEn -- 0=disabled, 1=enabled
Switched to Enabled at the OPR_RDY tran, then Disabled at power-down.
I-0023 ERT DN %d D160PowerEn -- 0=disabled, 1=enabled
Switched to Enabled at the OPR_RDY tran, then Disabled at power-down.
query.status:
K-0113 ERT DN %d CEState -- same as above
I-1108 (zoomed) ERT DN %d Ancillary CSMM Fine Position DAC -- see I-0108
I-1109 ERT DN %d Ancillary CSMM Coarse Position DAC -- see I-0109
K-0062 ERT EU %.4f SC Input Current -- 1010 in Boot, 970 in Opr,
1112 in MIPS modes, 1120-1128 when at large CSMM deflections.
Current is 27 mA larger than during MOS test.
K-0061 ERT EU %.4f SC Input Voltage -- 29.78 +/- 0.2. Voltage
was 30.53+/-.04 during MOS test. Power draw is identical in
MOS and flight cases.
K-0063 ERT EU %.4f CS 5V Monitor -- <> = 5.05 +.02/-.04 V MOS -- 5.06
K-0064 ERT EU %.4f IES 5V Monitor -- <> = 4.9845 +/- .002 V with MIPS on,
4.997 +/- .001V with MIPS off. MOS -- 4.980
K-0065 ERT EU %.4f IES 15V Monitor -- starts at 15.123 V, declines steadily
to 15.10 V during 1.5h of test. Climbed back to 15.105 V when MIPS was
turned off, then slowly relaxed back to 15.10 V. MOS -- 15.092-15.076
K-0066 ERT EU %.4f IES -15V Monitor -- starts at -15.126 V, declines
to -15.121 +/- .001 V during test. Goes to -15.124 +/- .001 V when
MIPS is turned off. MOS -- did not examine telemetry
I-0121 ERT EU %.4f D160m5RefV -- <> = -4.9945 +/- .0005 V MOS -- 4.9945
I-0106 ERT EU %.4f D70AnalogRtn -- <> = 0.0003 +/- 0.0002 V MOS -- .00015
I-0104 ERT EU %.4f D70m5RefV -- <> = -.5.0008 +/- .0006 V MOS -- -5.0015
K-0067 ERT EU %.4f SiDet5VDRef -- <> = 5.0015 +/- .0010 V MOS -- 5.0010
K-0081 ERT EU %.4f SiDet10VARef -- starts at 10.520 V, grows to 10.529 V
while MIPS is on, then grows more slowly to 10.532 V after MIPS is
turned off. MOS -- 10.547 V, with .002 V growth.
K-0082 ERT EU %.4f SiDet12VARef -- starts at 11.915 V, grows to 11.9245 V
while MIPS is on, then grows more slowly to 11.927 V after MIPS is
turned off. MOS -- 11.931 V, with .001 V growth.
K-0074 ERT EU %.4f SiDet5VARef -- <> = 4.9865 +/- .0008 V MOS -- 4.984
K-0083 ERT EU %.4f SiDetM12VARef -- starts at -12.098 V, grows to -12.106 V
while MIPS in on, then grows slowly to -12.107 V after MIPS is turned off.
MOS -- -12.103
K-0076 ERT EU %.4f VD Boost Voltage -- <> = 1.9995 +/- .002 V MOS -- 1.9965
K-0075 (zoomed) ERT EU %.4f VD Sub Voltage -- <> = 3.495 +/- .002 V, jumps to
4.468 +/- .002 V during Si anneals. MOS -- not checked
K-0325 ERT DN %d SiSetVoltLvl -- 0(Off), 1(Anneal), 2(SWave)
Registered Off until MIPS_MRdy_MObs tran, then went to SWave.
Dropped to Anneal during the MIPS-900 and MIPS-015 anneals,
otherwise stayed at SWave until power-down.
K-0077 ERT EU %.5f Si Preamp Offset Chan1 Voltage -- 6.138 V at power-up,
then switched to 5.887 +/- .0015 V in MIPS-900, following Si anneal.
MOS -- 5.889
K-0078 ERT EU %.5f Si Preamp Offset Chan2 Voltage -- 6.132 V at power-up,
then switched to 5.882 V in MIPS-900. MOS -- 5.8855
K-0079 ERT EU %.5f Si Preamp Offset Chan3 Voltage -- 6.133 V at power-up,
then switched to 5.882 V in MIPS-900. MOS -- 5.885
K-0080 ERT EU %.5f Si Preamp Offset Chan4 Voltage -- 6.134 V at power-up,
then switched to 5.882 V in MIPS-900. MOS -- 5.885
I-0127 ERT EU %.5f Det 70um QReset High Level Voltage -- <> = -1.8971
+/- .0003 V MOS -- -1.8972
I-0128 ERT EU %.5f Det 160um QReset High Level Voltage -- <> = 1.8973
+/- .0003 V MOS -- -1.8972
I-0101 (zoomed> ERT EU %.2f Det 70um Unit Cell Drain Current A-half --
Drop from 14.4 uA at MIPS Ready to 13.65 uA in 25min leading
up to first Si anneal, then basically stable. Spikes to
105 uA during rail-to-rail test, 17 at scanpos 101 in scattered
background monitor test, 55 at scanpos 102, 22 at scanpos 103,
and 74 at scanpos 104. The settling behavior was seen in MOS
testing, but not the increased current draw due to low background
in the dark regions.
I-0102 (zoomed> ERT EU %.2f Det 70um Unit Cell Drain Current B-half --
Drop from 13.3 uA at MIPS Ready to 12.75 uA in 25min leading
up to first Si anneal, then basically stable. Spikes to
105 uA during rail-to-rail test, 14 at scanpos 101 in scattered
background monitor test, 56 at scanpos 102, 17 at scanpos 103,
and 76 at scanpos 104.
I-0111 ERT EU %.2f Det 160um Unit Cell Drain Current A-half --
Drop from 17.3 uA at MIPS Ready to 16.65 uA in first 20min, then
basically stable, although there are frequent spikes to 16.98 uA
in scanpos 0 data. Due mostly to the influence of the scan mirror
telemetry on the telemetry from this channel and not to light
levels, we see jumps to 29-32 uA during rail-to-rail test and
24um portion of scattered background monitor, drop to 16 uA at
scanpos 1 in 70um phot, drop to 9 uA at scanpos 102, jump to
21 uA at scanpos 103, drop to 5 uA at scanpos 104. In MOS tests,
the mean was 18 +/- 2 uA, with CSMM-induced jumps to 6 at scanpos 104,
11 at scanpos 102, 23 at scanpos 103, and 31 uA at scanpos 101.
I-0112 ERT EU %.2f Det 160um Unit Cell Drain Current B-half --
Drop from 18.3 uA at MIPS Ready to 17.75 uA in first 30min, then
basically stable. Jumps to 21 uA in rail-to-rail test, up to
18.3 uA at scanpos 101, down to 17.0 uA at scanpos 102, no change
at scanpos 103, down to 17.2 uA at scanpos 104. Measured 19.25 uA
in MOS tests, with occasional excursions of +/- .5 uA.
I-0211 ERT EU %.5f Det 70um Reset Voltage 1 @detector <>= -1.30925+/-.00018
I-0212 ERT EU %.5f Det 70um Reset Voltage 2 @detector <>= -1.30335+/-.00018
I-0213 ERT EU %.5f Det 70um Reset Voltage 3 @detector <>= -1.30958+/-.00018
I-0214 ERT EU %.5f Det 70um Reset Voltage 4 @detector <>= -1.29930+/-.00018
I-0215 ERT EU %.5f Det 70um Reset Voltage 5 @detector <>= -1.31111+/-.00018
I-0216 ERT EU %.5f Det 70um Reset Voltage 6 @detector <>= -1.30845+/-.00018
I-0217 ERT EU %.5f Det 70um Reset Voltage 7 @detector <>= -1.31361+/-.00018
I-0218 ERT EU %.5f Det 70um Reset Voltage 8 @detector <>= -1.30695+/-.00018
I-0201 ERT EU %.5f Det 160um Reset Voltage 1 @detector <>= -1.3370 +/- .0002
I-0202 ERT EU %.5f Det 160um Reset Voltage 2 @detector <>= -1.3127 +/- .0002
I-0203 ERT EU %.5f Det 160um Reset Voltage 3 @detector <>= -1.31285 +/- .0002
I-0204 ERT EU %.5f Det 160um Reset Voltage 4 @detector <>= -1.3105 +/- .0002
I-0099 ERT EU %.5f Det 70um Offset Voltage A-half <>= 4.0250 +/- .0006
I-0100 ERT EU %.5f Det 70um Offset Voltage B-half <>= 3.9853 +/- .0005
I-0113 ERT EU %.5f Det 160um Offset Voltage A-half <>= 3.9808 +/- .0001
I-0114 ERT EU %.5f Det 160um Offset Voltage B-half <>= 3.9811 +/- .0005
I-0105 ERT EU %.5f Det 70um Load Current Adjust Voltage <>= -1.0955 +/- .0006
I-0120 ERT EU %.5f Det 160um Load Current Adjust Voltage <>= -1.0964 +/- .0003
I-0200 ERT EU %.5f Det 160um Common Bias Voltage at Detector<>= 0.0279 +/-.0003
at start, drifting to 0.0285 at MIPS power-off.
I-0210 ERT EU %.5f Det 70um Common Bias Voltage at Detector <>= 0.0344+/-.0004
K-0058 ERT EU %.2f CEBoxTmp -- started at -2C, climbed to 5.5C at MIPS
power-off, then climbed more slowly to 8.6C.
K-0056 ERT EU %.2f CPUTmp -- started at -1C, climbed to 7.5C at MIPS
power-off, then climbed more slowly to 11C.
I-0130 ERT EU %.2f D160BoardTmp -- started at 6C, climbed to 21C at
MIPS power-off. Temperature climb accelerated when the CSMM was at
large deflection angles.
K-0060 ERT EU %.2f D70BoardTmp -- started at -5C, climbed to 11.5C
at MIPS power-off.
K-0057 ERT EU %.2f DataAcqTmp -- started at -1C, climbed to 15C at
MIPS power-off, then climbed more slowly to 18C.
K-0051 ERT EU %.2f IOTmp -- started at -5C, climbed to 5.5C at MIPS
power-off, then continued to climb to 11C. Jump of -1C seen during
the MIPS operations. Surprisingly, the temperature curve changed
to this second offset after MIPS was turned off. I do not have a
good explanation yet for this behavior.
K-0052 ERT EU %.2f CSLVPSTmp -- started at -2C, climbed to 12.5C at
MIPS power-off, then climbed to 16.5C. Jump of -1C seen during
MIPS operations, analogous to the IOTmp.
K-0053 ERT EU %.2f IESLVPSTmp -- started at -1C, climbed to 16C at
MIPS power-off, then continued to climb to 19.5C.
K-0054 ERT EU %.2f SiCntlTmp -- started at -1.5C, climbed to 10C
at MIPS power-off, then spiked to 10.5C, relaxed about 0.7C, then
resumed climbing to 13.3C.
K-0055 ERT EU %.2f SiSigTmp -- started at -3C, climbed to 13C at
MIPS power-off, then relaxed to 12C before resuming climb to 15C.
I-0122 ERT DN %d CSM_GainAdj -- CE1: <>= 9460 +/- 1, same as in MOS.
I-0129 ERT DN %d CSM_PosOfst -- CE1: <>= 21515.5 +/- 1.5, same as in MOS.
I-0315 ERT DN %d CSM_GainCmd -- CE1: 2916
I-0316 ERT DN %d CSM_PosOfCmd -- CE1: 88
K-0046 ERT EU %.4f CSMMTmp -- <> = 2.323 +/- .005K, with a jump to 2.38K
during the MIPS-900 Si anneal and a jump to 2.445K during the MIPS-015
anneals.
I-0393 ERT EU %.2f D24 Commanded Control Temperature -- set to 5.2K
K-0360 ERT DN %d D24HtrDAC -- see plot. Turned on during Opr_Rdy
and following each of the anneals, with a bit of overshoot and fairly
long settling time. Dropped noticeably (10-20 DN) during rail-to-rail
and scattered light tests. The clocking of the array obviously
produces some heat that lessens the need for heater power.
K-0072 ERT EU %.4f D24HtrCur -- see plot. Initial jump to 102 uA,
then relaxed to scanpos 0 nominal of 98 uA. Drops to 0 during
anneals and to 91-94 during exposures.
K-0035 (zoomed) ERT EU %.4f D24TmpA -- Nominal value of 5.2 +/- .1 K. Jumps
to 25.5K during anneals.
K-0036 (zoomed) ERT EU %.4f D24TmpB -- Nominal value of 5.2 +/- .1 K. Jumps
to 25.2K during anneals.
K-0039 ERT EU %.4f D70BaseTmp -- Nominal value of 2.17 +/- .05 K,
with jumps to 2.28K during Si anneals. Early note that the
baseplate temps dropped to about 1.58K by the time of campaign B.
K-0041 (zoomed) ERT EU %.4f D70TmpA -- 1.799 +/- .001K. Jumps to 1.815K
during Si anneals. Jump to 2.30K during 70um anneal. Jump to
1.85K during 160um anneal. Early note that the Ge array temps
dropped to about 1.5K by the time of campaign B.
K-0042 (zoomed) ERT EU %.4f D70TmpB -- 1.7995 +/- .0005K. Jumps to 1.815K
during Si anneals. Jump to 2.20K during 70um anneal. Jump to
1.84K during 160um anneal.
K-0040 ERT EU %.4f D160BaseTmp -- 2.175 +/- .005K. Jump to 2.34K
during Si anneals.
K-0043 ERT EU %.4f D160TmpA -- 1.791 +/- .001K. Jump to 3.03K
during 160um anneal.
K-0045 ERT EU %.4f D160TmpB -- 2.757 +/- .001K. Jump to 4.8K
during 160um anneal.
query.AllElse, DN items:
K-0113 ERT DN %d CEState -- as above
I-0087 ERT DN %d CSM_Rollover -- 0 (nominal) or 1 (Error).
Set to 0 when telemetry item became active in MIPS_Opr_MRdy.
I-0048 ERT DN %d D160Qrst -- either 1 (active) or 0 (off).
Many toggles between these two states, with no correlation to when
we were taking science data.
I-0047 ERT DN %d D70Qrst -- either 1 (active) or 0 (off).
Many toggles between these two states, with no correlation to when
we were taking science data.
I-0051 ERT DN %d D24BoostCmd -- either 1 (enable) or 0 (disable).
One boost enable seen at the start of each exposure command, then
set back to disabled at the next telemetry update.
I-0050 ERT DN %d D24ResetCmd -- either 1 (enable) or 0 (disable).
Numerous reset enable values seen during data collection times.
The telemetry value does not immediately jump back to disable
after an enable event.
I-0361 ERT DN %d D24HtrEn -- Enabled in MIPS_MRdy_MObs transition,
then enabled again for each of the Si anneals and when heater monitoring
was reestablished after an anneal.
K-0353 ERT DN %d D24StimCmd -- reads 0 (disabled) or 1 (enabled).
Set to disabled in OFF_Boot and then never changed.
**Note on MemMonitor telemetry channels: These telemetry channels all
bounce around a lot in their values until the MemMon command was
sent following the MIPS_MRdy_MObs state transition.
K-0017 ERT DN %d MemMonitor1 -- 70Fld = 51 (0x33)
K-0018 ERT DN %d MemMonitor2 -- 70Flat = 192 (0xC0)
K-0019 ERT DN %d MemMonitor3 -- 160Fld = 64 (0x40)
K-0020 ERT DN %d MemMonitor4 -- 24FldB (CE1) = 51 (0x33)
K-0021 ERT DN %d MemMonitor5 -- 24FlatA(CE1) = 42 (0x2A)
K-0022 ERT DN %d MemMonitor6 -- 24FldB (CE2) = 51 (0x33)
K-0023 ERT DN %d MemMonitor7 -- 24FlatA(CE2) = 42 (0x2A)
K-0024 ERT DN %d MemMonitor8 -- SiDiffThresh = 600
K-0025 ERT DN %d MemMonitor9 -- SiFirstDCEIgnoreFrames = 1
K-0026 ERT DN %d MemMonitor10 -- SiIgnoreFrames = 1
I-0371 ERT DN %d MIPS Group Count -- Reads 0 or 1 at all times except
during the Proc Load test, when I saw it count as high as 60. Not a
useful telemetry item except in ancillary mode.
K-0263 ERT DN %d SciFIFO Bad half-full interrupts -- set to 0 during
OFF_Boot and then never changed.
K-0265 ERT DN %d SciFIFO Half-full interrupt counter -- Lots of
interrupts seen, incrementing the counter from 0-255 many times.
K-0277 ERT DN %d SciFIFO Timeout Counter -- We expected these during
diagnostic data collects and Coadd=8 data (Proc Load test). We see
timeouts at several times besides this, and an explanation is needed.
K-0276 ERT DN %d SDMGroupFail (not accepted by CDH) -- set to 0 during
OFF_Boot and then never changed.
query.AllElse, EU items:
I-0126 ERT EU %.2f D160AnHtrCur -- Read 14.88-14.89 during 160um anneal,
-0.06 at other times.
I-0124 ERT EU %.2f D70AnHtrCur -- Read 9.99 during 70um anneal,
-0.06 at other times.
K-0088 ERT EU %.2f D24AnnealCur -- 620.20 uA value set at time of Si anneal,
then never reset to anything else.
K-0038 ERT EU %.4f D160JnctTmp -- 1.7475 +/- .001K, with jumps to 1.754K
during Si anneals.
K-0044 ERT EU %.4f D160StimTmp -- 2.15 +/- .005K, with jumps to 2.31K
during Si anneals.
K-0037 ERT EU %.4f D70JnctTmp -- 1.792 +/- .002K, with jumps to 1.808K
during Si anneals, 2.06K during 70um anneal, and 1.83K during 160um anneal.
K-0059 ERT EU %d D24StimCur -- FlatA: DN, uA
FloodB: DN, uA
High stim brightnesses: FlatA: DN, uA
FloodB: DN, uA
This telemetry item was never set to anything other than 0 during
campaign A.
A number of telemetry channels produced different results than I expected based on ground testing. Further analysis will be made of each of these items. The channels in question are the following: K-0346 SiAnnealEnbl -- Does not go back to disabled when the anneals are over. This proved to be operator error, due to the use of ERT rather than SCET in the query files. I-0078 CalibCyclCmd -- during the scattered background monitor test, the CalibCyclCmd should have been set to 33 for all of the 3s DCEs, but instead it was changed to 25 for scanpos 103 and to 11 for scanpos 104 data. I-0101 Det 70um Unit Cell Drain Current A-half -- I-0102 Det 70um Unit Cell Drain Current B-half -- These two telemetry items registered about 14 uA, which is less than the nominal value of about 80-90 uA. The reduced current draw is expected based on the high light levels and strong saturation of the detector arrays. K-0052 CSLVPSTmp -- K-0051 IOTmp -- Two temperature curves are seen, separated by 1C. Somehow MIPS transitioned between these two curves in the middle of operations and stayed on the second curve after being powered off. This is true for both of these telemetry items. K-0045 D160TmpB -- Should read about 1.8K, but instead reads 2.757K. The temperature curve for this item is still wrong. K-0277 ERT DN %d SciFIFO Timeout Counter -- We expected these during diagnostic data collects and Coadd=8 data (Proc Load test). We see timeouts at several times besides this, and an explanation is needed.